Abstract
Vanadium pentoxide (V2O5) thin film were deposited using the sol-gel technique. An aqueous solution of V2O5was used for depositing the thin films on glass substrates. The structural and optical characteristics of both non-annealed and annealedV2O5 thin films were examined with X-ray diffraction (XRD) and double-beam UV-visible spectrophotometry. The X-ray diffraction study of the V2O5thin films revealed a mixture of amorphous and polycrystalline nature. The dispersion of the refractive index is discussed in term of Wlemple-DiDomenico single oscillator model, many dispersion parameters such as single oscillator energy (Eo ),dispersion energy ( Ed ), refractive index ( n(0) ), were discussed using Miller’s rule, the optical absorption at the fundamental absorption edge dielectric constant (e¥), moment of the dielectric constant optical spectrum( M-1 ,M-3 )and energy gap by Wimple-DiDomenico approximation ( )have been calculated, non- linear optical susceptibility ( ) has been discussed, direct energy gap by Tauc relation ( ), and Urbach energy of the localized states (Eu) were also calculated. The results were found to be consistent with the data of the previous studies carried out on V2O5 thin films.https://doi.org/10.31257/2018/jkp/100101
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