Abstract
Space based systems are looking more and more to the benefits from high performance, reconfigurable computing systems and Commercial Of The Shelf components (COTS). One critical reliability concern is the behaviour of the complex integrated circuits in a radiation environment. Field programmable gate arrays (FPGAs) are well suited for the small volumes in space applications. This type of products are driven by the commercial sector, so devices intended for the space environment must be adapted from commercial product. Heavy ion characterisation has been performed on several FPGA types and technologies to evaluate the onorbit radiation performance. As the geometry keeps shrinking, the relative importance of various radiation effects may change. Investigation of radiation effects on each technology generation is found to be necessary. This paper presents methodologies and results of radiation tests performed on commercial FPGA s for space applications. Mitigation of Single Event Upsets will be discussed.
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