Abstract
A commonly used organization for built-in self-test of VLSI (very large-scale integration) circuits uses complete or pseudorandom test input generators followed by output data reduction. Two compression techniques which have been used are polynomial division (signature) and ones counting (syndrome). The simultaneous use of both of these approaches in parallel is investigated. Analytic and enumerative results indicate that the number of error patterns which are missed by both methods together is nearly the theoretical minimum. The conclusion extends to signature compression combined with any other counter-based compression method such as the use of Walsh spectral coefficients. Some suggestions for CAD (computer-aided design) implementations of test design are given based on these results. >
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.