Abstract
We present a method to reconstruct the near-water-film air temperature and humidity distributions synchronously by measuring the phase delays based on dual-wavelength digital holographic interferometry. A falling water film device was used to create a water film evaporation environment and generate axially uniform temperature and humidity fields. The relationship between air temperature, humidity and phase delay is derived from the Edlen equations. With such relationship, the temperature and humidity distributions can be solved directly according to phase delays of two different wavelengths. An edge phase enhancement method and an error elimination method with PSO are presented to improve the measurement accuracy. The temperature and humidity fields in the falling water film model were experimentally reconstructed with temperature deviation of 0.06% and relative humidity deviation of 2.61%.
Published Version
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