Simulation of water treeing in cable with nanofiller and analysis of EMI in a ruptured cable

Abstract

We need materials to resemble as ideal as possible but impurities and voids exceeding a prescribed level reduce the ability of material to perform its desired functionality. So, voids and impurities will definitely reduce the dielectric strength of a dielectric. Cables can also cause disturbances due to EMI and EMS if the metallic shield is damaged; this case is mainly with the Coaxial cables which are used in industries. So, basically what is done is in this project is two separate analysis has been conducted for the cable (1.) due to water voids and inhibition of field due to water voids with nano filler Titanium Oxide. This is performed by simulating the model of XLPE cable with water void and with water void and nano filler. From the simulations it is inferred that the field effect is higher outside the periphery of the water voids and as field interacts with the other water voids, it creates a high electrical stress channel. Titanium Nano Filler has been added to check if its addition is helping in the inhibition of the path of electric field distribution. The whole simulation has been done considering constant conductivity and permittivity of the material and (2.) analysis of the electromagnetic interference caused by the cable. In this section we analyze the cable which is ruptured and due to which a slot is created through which electric field is leaking. Different slot angle has been created for the analysis of electromagnetic field and exposure of electromagnetic interference is plotted as line graph to check how much field is emerging out on increasing and decreasing the axial slot angle. This will give insight about the amount of EMI interfering with the nearby objects which is very crucial for the High Voltage equipment's else the losses will increase significantly.