Abstract

A silicon single-electron memory showing clear hysteresis at 4.2K is demonstrated. The memory structure consists of three integrated silicon nanowires. The capability of the memory to read, write and erase electrons from the storage node is shown. The CMOS-compatible fabrication process allows for future integration of these devices with CMOS technology.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call