Abstract
Abstract We present experimental results on YBCO thin film bi-crystal junctions in which additional metallic shunt resistors are added by in-situ evaporation of gold or silver. These junctions are intended for use in the development of an HTS Josephson noise thermometer for primary temperature scale use. The temperature dependence of the critical current and effective shunt resistance are reported and the noise arising from the shunted junctions when biased into the finite voltage regime has been assessed as a function of frequency. This is compared with the predictions of a simple model and the implications for the potential accuracy of the proposed thermometer are considered.
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