Sensitivity of Standard Library Cells to Optical Fault Injection Attacks in IHP 250 nm Technology

Abstract

The IoT consists of a lot of devices such as embedded systems, wireless sensor nodes (WSNs), control systems, etc. It is essential for some of these devices to protect information that they process and transmit. The issue is that an adversary may steal these devices to gain a physical access to the device. There is a variety of ways that allows to reveal cryptographic keys. One of them are optical Fault Injection attacks. We performed successful optical Fault Injections into different type of gates, in particular INV, NAND, NOR, FF. In our work we concentrate on the selection of the parameters configured by an attacker and their influence on the success of the Fault Injections.