Abstract
Polyacetylene (CH) x is actually a very studied material due to its remarkable semiconducting properties. In particular, its electrical conductivity increases of more than twelve orders of magnitude by doping processes. (CH) x can be doped both p-type (e.g., with halogens, SbF 5, AsF 5) and n-type (e.g., with alkalis). We present here: i) qualitative studies, by scanning electron microscopy, on film morphology as a function of the preparation process and the dopant concentration, and ii) quantitative analysis, by Castaing microprobe, of dopant concentration profile in a cross-section of the film.
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