Abstract
YBa2Cu3O7−δ (YBCO) films with Zr doping have been prepared successfully by thetrifluoroacetate metal–organic deposition (TFA-MOD) method through dissolvingZr acetylacetonate in the precursor solution. Yttria-stabilized zirconia (YSZ)nanoparticles were detected in the doped YBCO films by x-ray diffraction(XRD) and scanning electron microscopy (SEM). From the analysis of XRDω and φ scans, the doped films have better out-of-plane and in-plane textures than those of the un-dopedYBCO film. Although the doped YBCO films have a lower critical transition temperature(Tc) than that of un-doped YBCO film, a very significant enhancement of critical current density(Jc) is displayed as compared to the un-doped film at high applied fields. A highJc near106 A cm−2 at 1 Tand a Jc of 105 A cm−2 at 5 T were observed in 6% doped Zr film, which are 5 times and 25 times theJc values of the un-doped film in the same applied fields, respectively, indicating an optimaldefect density created by 6% Zr doping.
Published Version
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