Abstract
We report on the nonlinear optical performance of sub-μm ZnO films grown by metal organic aerosol deposition on r-plane sapphire substrates. These films display scale-like nanocrystalline structures. Layers of different crystallite sizes and shapes are studied. Both, x-ray diffractometry and the characteristic angular and polarization dependence of the second harmonic generation, indicate a strongly uniform a-axis orientation of the crystallites. Using 35-fs Ti:sapphire laser pulses, we demonstrate much higher conversion efficiencies for ZnO layers than previously reported. The robust performance at normal incidence makes this device suitable for advanced pulse characterization techniques.
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