Abstract
Review of: “ELECTRONICS RELIABILITY AND MEASUREMENT TECHNOLOGY - NONDESTRUCTIVE EVALUATION” Edited by Joseph S. Heyman, Noyes Data Corporation, Noyes Publications, New Jersey, December 15, 1988. (Based on a Workshop held at NASA Langley Research Center, June 1986) xii plus 128 pages, $39.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
