Abstract
A dielectric cell with a Teflon spacer covering the entire perimeter is advantageous for impedance experiments performed at electric fields of 450 kV/cm or more using a 10 μm electrode separation. While the large spacer surface makes a correction to the infinite frequency dielectric constant necessary if reliable permittivity data are desired, field induced relative changes are extremely insensitive to this problem. It is demonstrated that the field induced relative changes of the loss factor, tan δ, with and without correcting for the excess parallel capacitance are practically the same.
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