Abstract

A silicon (Si) micro electro mechanical system (MEMS) package using a lightly-doped Si chip carrier for coplanar waveguide (CPW) microwave and millimeter-wave integrated circuits (MMICs) is proposed in order to reduce parasitic problems of leakage, coupling, and resonance. The proposed chip carrier scheme is verified by fabricating and measuring a high resistivity silicon (HRS, 10 k/spl Omega//spl middot/cm) CPW on three types of carriers (conductor-back metal, lightly-doped Si, and HRS) in the frequency range 0.5 to 40 GHz. The proposed MEMS package using the lightly-doped (15 /spl Omega//spl middot/cm) Si chip carrier and the HRS shows low loss and is resonance-free since the lightly-doped Si chip carrier effectively absorbs and suppresses the resonant leakage. The Si MEMS package for CPW MMICs has an insertion loss (S/sub 21/) of 2.0 dB, a reflection loss (S/sub 11/) of 10 dB, and a power loss (PL) of 6.0 dB up to 40 GHz.

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