Resist evaluation for proton beam writing, Ni mold fabrication and nano-replication

Abstract

Proton beam writing (PBW) is a new direct-write technique which has shown great potential to fabricate structures down to 20 nm level in resist material. Protons can be accelerated up to a high energy (3.5 MeV) at Centre for Ion Beam Applications. Because the mass of a proton is much larger than the mass of an electron (mp:me = 1,800:1), the energy of the secondary electrons is very small compared with secondary electrons generated by electron beam lithography. Therefore, a proton will travel along a straight path into resist and secondary electrons will only expose the resist within several nanometers around the path of the proton. PBW is capable of fabricating structures with very straight, vertical and smooth sidewalls without proximity effect. This is very important when combining PBW with Ni electroplating and nanoimprinting as well as injection molding. High quality Ni molds with smooth and vertical side walls are critical in nanoimprint lithography and injection molding. In our experiments, several new resists including AR-P 3250, a mixture of AR-P 3250 and AR 300-12, and ma-N 2401 are tested with PBW for the production of high aspect ratio Ni molds and thermoplastic replication with these molds. High aspect ratio structures (up to 7) are fabricated at a width of 500 nm in Ni molds. The structures are transferred to plastic via nanoimprinting and injection molding.