Abstract
Traditional life evaluation method mainly attached to electrical parameters as reliability characterization parameters, ignoring the negative effects that the potential defects have on reliability evaluation of components. To reflect the differences between the individual samples, the failure modes and failure mechanisms of the optocouplers in storage environment is summarized and analyzed. The characterization of low frequency noise on optocouplers failure and defects is studied. The evaluation method and procedure of optocouplers storage life is formulated base on low frequency noise classification, and the classification criterions of Burst Noise, Generation-Recombination Noise (g-r Noise) and 1/f Noise are given. Based on this classification method, an application research on HCPL2530 optocoupler samples storage life evaluation has been carried out, and three evaluation results from the kinds of samples are obtained. The obvious differences among results from the three kinds of samples reflect the samples' traits.
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