Abstract
This article describes the construction and operation of a source of 2–5 keV argon atoms for use in the strong (1–7 T) B-field environment of a photoelectron spectromicroscope. The velocity spread of the atom beam has been determined from the time of flight. Atom-induced secondary-electron yield measurements on selected areas of various metallic elemental samples are described and the results show that yields differ by up to a factor of 4×103 between elements and trend towards lower yields with increasing atomic number. A number of ultraviolet photoelectron spectra of the fast-atom sputter-cleaned sample surfaces are also presented. These spectra are angle-integrated over the full 2π of electron-emission angles.
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