First experimental and simulation study on the secondary electron and photoelectron yield of NEG materials (Ti–Zr–V) coating under intense photon irradiation

Abstract

A beam duct coated with NEG materials (Ti, Zr, V), which had been known to have a low secondary electron yield (SEY), was studied for the first time under intense photon irradiation using a positron beam at the KEK B-Factory (KEKB) to investigate a way to suppress the electron cloud instability (ECI). A 2.56 m test copper chamber was coated with the NEG materials (we call it NEG coating here) by magnetron sputtering. It was installed at an arc section of the KEKB positron ring, where the chamber was irradiated by direct photons with a line density of 6.5×10 14 photons m −1 s −1 mA −1. The vacuum pressure around the test chamber during a usual beam operation was lower than the case of non-coated copper chambers by a factor of 4–5. The number of electrons around positron bunches was measured by a special electron monitor up to a stored beam current of 1600 mA. The measured electron current, however, was almost the same as a non-coated copper chamber, especially at low-beam currents, and the effect of the NEG coating was smaller than expected. A simulation explained the result that abundant photoelectrons in the positron ring reduce the effect of the low SEY. The maximum SEYs of the NEG coating and non-coated copper were evaluated using a simulation as about 0.9–1.0 and 1.1–1.3, respectively, which were consistent with the values after a sufficient electron bombardment. Their photoelectron yields were also estimated as 0.22–0.28 and 0.26–0.34, respectively, and were in good agreement with the previous experimental results. The study indicates that the suppression of photoelectrons, by a beam duct with an antechamber, for example, is indispensable to make effective use of a surface with a low SEY, such as the NEG coating.