Abstract
NOTE FROM ACM: It has been determined that this paper plagiarized earlier works. Therefore ACM has shut off access to this paper. The paper by Pankaj Kumar and Kamlesh Dutta plagiarizes the following work: Marc Eaddy, Vibhav Garg, Alfred Aho, Nachiappan Nagappan, Kaitlin Duck Sherwood, "On the Relationship between Crosscutting Concerns and Defects: An Empirical Investigation" found here , as well as the article: Eaddy, M.; Zimmermann, T.; Sherwood, K.D.; Garg, V.; Murphy, G.C.; Nagappan, N.; Aho, A.V.; , "Do Crosscutting Concerns Cause Defects?," Software Engineering, IEEE Transactions on , vol.34, no.4, pp.497-515, July-Aug. 2008 . http://dx.doi.org/10.1109/TSE.2008.36 . For further information, contact the ACM Director of Publications.
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