Abstract
Relations among kp, fr·d, Qm and domain configurations in some piezoelectric ceramics with various Qm values were investigated under a polarization process (poling treatment) and depolarization process (applied stress treatment). In those materials, kp values in Pb(Zr0.17)(Ti0.33)(Ni1/3Nb2/3)0.5O3 ceramics (low Qm) decreased markedly with applied uniaxial compressive stress increase, and became 0.402 from 0.702 (initial kp value) by 49 MPa, while 90° and 180° domain patterns revealed by chemical etching were not changed, even by either poling or applied stress treatments. However, kp values in (Pb0.625Ca0.375)TiO3 ceramics (high Qm) decreased slightly by 49 MPa, and a clear difference in the 90° domain pattern arrangement was observed before and after both poling and applied stress treatments.
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