Abstract
Gaseous and liquid xenon particle detectors are being used in a number of applications including dark matter search and neutrino-less double beta decay experiments. Polytetrafluoroethylene (PTFE) is often used in these detectors both as electrical insulator and as a light reflector to improve the efficiency of detection of scintillation photons. However, xenon emits in the vacuum ultraviolet (VUV) wavelength region (λ≃175 nm) where the reflecting properties of PTFE are not sufficiently known. In this work, we report on measurements of PTFE reflectance, including its angular distribution, for the xenon scintillation light. Various samples of PTFE, manufactured by different processes (extruded, expanded, skived, and pressed) have been studied. The data were interpreted with a physical model comprising both specular and diffuse reflections. The reflectance obtained for these samples ranges from about 47% to 66% for VUV light. Other fluoropolymers, namely, ethylene tetrafluoroethylene (ETFE), fluorinated ethylene propylene (FEP), and perfluoro-alkoxyalkane (PFA) were also measured.
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