Abstract
Optical properties of TlInGaAs quaternary alloy were studied by spectroscopic ellipsometry (SE), reflectance, and transmittance. Spectroscopic ellipsometry and reflectance measurements suggest that TlInGaAs is a semiconductor system having a temperature-stable refractive index. The square of the absorption spectra, /spl alpha//sup 2/, measured by transmittance, also determined the temperature-stable E/sub 0/ edge. It was found that the temperature coefficients of both refractive index and E/sub 0/ edge of TlInGaAs are much smaller than those for InGaAs. These results facilitate the fabrication of the temperature-stable-wavelength optoelectronic devices using this alloy system.
Published Version
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