Radiation induced lattice defects in natural zircon (ZrSiO4) observed at atomic resolution

Abstract

Fission tracks and point defects in natural zircon are directly observed by a 1 MV electron microscope at atomic resolution for three types of samples adjusted to the 100 orientation. Lattice planes intersecting the fission tracks at high angles are distorted in a rather irregular manner over a wide region up to more than 100 A wide. Diameter of the tracks, ranging from 25 A to 40A, is much narrower than those so far reported for the U-doped synthetic zircon (100–200 A), UO2 thin film (100 A), mica (66 A, 240 A) or fluorophlogopite (150 A). The fact that fairly long tracks thousands of angstroms in length are observed in thin 100-oriented sample hundreds of angstroms in thickness and that some of them are nearly parallel to a low index lattice plane suggest a possible occurrence of channelling in the process of track formation. Parallel tracks often observed in chemically etched specimens support the idea of channelling. Slightly bent tracks are sometimes observed. It is concluded from computer simulation that many contrast anomalies of bright and dark spots in the lattice image are due to point defects of vacancies and interstitial atoms, mainly produced by the direct atomic collision with α-particles or by passage of ionizing nuclear particles. Optimum conditions of the observation of point defects with highest contrast are studied. One interstitial Zr atom or one Zr ion vacancy will give very low contrast and will be not detectable unless the crystal is less than two unit cells thick. A pair of Zr ion vacancies, however, yields extended detectable limit of thickness. Some of the observed defects are in good accordance with those simulated.