Quantitative observation and discrimination of AlGaN- and GaN-related deep levels in AlGaN∕GaN heterostructures using capacitance deep level optical spectroscopy

Abstract

Deep levels were observed using capacitance deep level optical spectroscopy (DLOS) in an AlGaN∕GaN heterostructure equivalent to that of a heterojunction field effect transistor. Band gap states were assigned to either the AlGaN or GaN regions by comparing the DLOS spectra in accumulation and pinch-off modes, where the former reflects both AlGaN- and GaN-related defects, and the latter emphasizes defects residing in the GaN. A band gap state at Ec−3.85eV was unambiguously identified with the AlGaN region, and deep levels at Ec−2.64eV and Ec−3.30eV were associated with the GaN layers. Both the AlGaN and GaN layers exhibited additional deep levels with large lattice relaxation. The influence of deep levels on the two-dimensional electron gas sheet charge was estimated using a lighted capacitance-voltage method.