Abstract
X-ray mapping using energy dispersive spectroscopy or wavelength dispersive spectroscopy is a very popular characterisation tool for determining the elemental distribution in materials. Furthermore, quantitative X-ray mapping has become a very powerful technique enabling reliable quantitative results that can be an order of magnitude better than traditional analysis. Quantitative X-ray mapping is also far superior to regions of interest X-ray maps where low levels of an element or elemental overlaps are present.
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