Abstract
ABSTRACTPhase evolution in a yttria-partially-stabilized zirconia (Y-PSZ) thermal barrier coating (TBC) was studied by using quantitative electron probe x-ray mapping combined with microbeam x-ray diffraction. The as-sprayed coating contains a single t' phase with the composition of the feedstock material. After annealing at 1400 °C for 1 hour, the yttria content of the t' phase increases slightly to compensate for the formation of 0.06 mass fraction of a t phase containing 0.01 mole fraction YO1.5. These results are in contrast to those determined by bulk x-ray and neutron diffraction, and therefore highlight the need for multiple techniques of phase analysis in Y-PSZ.
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