Abstract
ChipIr is a new beamline at the ISIS spallation source dedicated to accelerated testing of microelectronics. ChipIr features an atmospheric-like neutron spectrum to study the so-called Single Event Effects, a major concern for the reliability of modern electronics at ground level and flight altitudes. A bespoke design was needed to extract a fast neutron beam from a neutron source designed for thermal neutron applications.The main objective of the Scientific Commissioning is to measure the flux, spectrum and profiles of the fast neutron beam in the different configurations of the beamline. In this work we present preliminary results of fast neutron measurements performed with a 70×70 mm2 neutron beam and the accelerator at 700 MeV. The neutron flux above 10 MeV was found to be 4.9 · 106 cm2s-1. The beam profile was found to be uniform within the 70×70 mm2 area. ChipIr is now in an advanced stage of scientific commissioning and beta-users have started the first tests in late 2016. The first ‘official’ deliberate error was measured in a SRAM chip on the 29 June 2016; an 8 bit memory containing 1’s had the 7th bit inverted to a 0 – just the kind of error that can occur in the atmosphere due to neutron interaction.These results are promising for an imminent start of the ChipIr user programme.
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