Proceedings of the 11th European Workshop of the European Microbeam Analysis Society (EMAS) on Modern Developments and Applications in Microbeam Analysis

Abstract

This volume of IOP Conference Series: Materials Science and Engineering contains papers from the 11th Workshop of the European Microbeam Analysis Society (EMAS) on Modern Developments and Applications in Microbeam Analysis which took place from 10–14 May 2009 in the Hotel Faltom, Gdynia, Poland.The primary aim of this series of workshops is to assess the state-of-the-art and reliability of microbeam analysis techniques. The workshops also provide a forum where students and young scientists starting out on careers in microbeam analysis can meet and discuss with the established experts. The workshops have a very distinct format comprising invited plenary lectures by internationally recognized experts, poster presentations by the participants and round table discussions on the key topics led by specialists in the field. For this workshop EMAS invited speakers on the following topics: EPMA, EBSD, fast energy-dispersive X-ray spectroscopy, three-dimensional microanalysis, and micro-and nanoanalysis in the natural resources industry.The continuing relevance of the EMAS workshops and the high regard in which they are held internationally can be seen from the fact that 69 posters from 16 countries were on display at the meeting and that the participants came from as far away as Japan and the USA. A number of participants with posters were invited to give short oral presentations of their work in two dedicated sessions. As at previous workshops there was also a special oral session for young scientists. Small cash prizes were awarded for the three best posters and for the best oral presentation by a young scientist. The prize for the best poster went to the contribution by G Tylko, S Dubchak, Z Banach and K Turnau, entitled Monte Carlo simulation for an assessment of standard validity and quantitative X-ray microanalysis in plant. Joanna Wojewoda-Budka of the Institute of Metallurgy and Materials Science, Krakow, received the prize for the best oral presentation by a young scientistfor her talk entitled Application of focussed ion beam technique for TEM multilayer materials examination.This volume contains the full texts of 5 of the invited plenary lectures and of 24 papers on related topics originating from the posters presented at the workshop. All the papers have been subjected to peer review by a least two referees.January 2009 AcknowledgementsOn behalf of the European Microbeam Analysis Society I would like to thank all the invited speakers, session chairs and members of the discussion panels for making the meeting such a great success. Special thanks go to Michal Zelechower and Luc Van't dack who directed the organisation of the workshop giving freely of their time and talents. As was the case for previous workshops, the EMAS board in corpore was responsible for the scientific programme. I am particularly grateful to the exhibiting companies and sustaining members for their generous support of the workshop. In this context I would like particularly to mention: Silesian University of Technology, Gliwice Gdansk University of Technology Polish Society for Microscopy (PTMi), Krakow Polish Academy of Sciences – Materials Science Committee, Warsaw Polish Academy of Sciences – Institute of Metallurgy and Materials Science, Krakow Polish Academy of Sciences – Institute of Physics, Warsaw AGH University of Science and Technology, Krakow Warsaw University of TechnologyBelow is a combined list of the exhibiting companies and sponsors of the workshop: Ametek GmbH (Germany) Blackwell Publishing Ltd (UK) Bruker AXS Microanalysis GmbH (Germany) Cameca SA (France) Carl Zeiss SMT GmbH (Germany) COMEF Aparatura Naukowo-Badawcza (Poland) EU-JRC: Inst. for Transuranium Elements (Germany) FEI Company (The Netherlands) IfG – Institute for Scientific Instruments GmbH (Germany) Jeol (Europe) SAS (France) John Wiley & Sons (UK) Olympus Soft Imaging Solutions GmbH (Germany) Oxford Instruments NanoAnalysis Ltd (UK) Probe Software, Inc. (USA) Roenalytic GmbH (Germany) Target-Messtechnik (Germany) Thermo Fisher Scientific BV (The Netherlands) Clive T Walker EMAS President János L Lábár Research Institute for Technical Physics and Materials Science, HAS, Konkoly-Thege M. u. 29-33, HU-1121 Budapest, Hungary Clive T Walker European Commission, Joint Research Centre, Institute for Transuranium Elements, P.O. Box 2340, DE-76125 Karlsruhe, Germany Michal Zelechower Silesian University of Technology, Department of Materials Science, ul. Krasinskiego 8, PL-40019 Katowice, Poland Pawel Zieba Polish Academy of Sciences, Institute of Metallurgy and Materials Science, ul. W. Reymonta 25, PL-30059 Krakow, Poland