Abstract

This volume of the IOP Conference Series: Materials Science and Engineering contains papers from the 14th Workshop of the European Microbeam Analysis Society (EMAS) on Modern Developments and Applications in Microbeam Analysis which took place from the 3rd to the 7th of May 2015 in the Grand Hotel Bernardin, Portorož, Slovenia.The primary aim of this series of workshops is to assess the state-of-the-art and reliability of microbeam analysis techniques. The workshops also provide a forum where students and young scientists starting out on a career in microbeam analysis can meet and discuss with the established experts. The workshops have a unique format comprising invited plenary lectures by internationally recognized experts, poster presentations by the participants and round table discussions on the key topics led by specialists in the field.This workshop was organized in collaboration with the Jožef Stefan Institute and SDM – Slovene Society for Microscopy. The technical programme included the following topics: electron probe microanalysis, STEM and EELS, materials applications, cathodoluminescence and electron backscatter diffraction (EBSD), and their applications.As at previous workshops there was also a special oral session for young scientists. The best presentation by a young scientist was awarded with an invitation to attend the 2016 Microscopy and Microanalysis meeting at Columbus, Ohio. The prize went to Shirin Kaboli, of the Department of Metals and Materials Engineering of McGill University (Montréal, Canada), for her talk entitled "Electron channelling contrast reconstruction with electron backscattered diffraction".The continuing relevance of the EMAS workshops and the high regard in which they are held internationally can be seen from the fact that 71 posters from 16 countries were on display at the meeting and that the participants came from as far away as Japan, Canada, USA, and Australia. A selection of participants with posters was invited to give a short oral presentation of their work in three dedicated sessions. The prize for the best poster was an invitation to participate in the 24th Australian Conference on Microscopy and Microanalysis (ACMM 24) in Melbourne, Australia. The prize was awarded to Aurélien Moy of the University of Montpellier (France) for his poster entitled: "Standardless quantification of heavy metals by electron probe microanalysis".This proceedings volume contains the full texts of 9 of the invited plenary lectures and of 12 papers on related topics originating from the posters presented at the workshop. All the papers have been subjected to peer review by a least two referees.

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