Procedures for Metallographic Examination and Mechanical Strength Testing of Fine Pitch Surface Mount IC Package Solder Joints

Abstract

The reduction in IC package lead pitches in surface mount solder assembly and the current high emphasis on quality and reliability of printed circuit assemblies have created a requirement for microanalysis of fine pitch solder joints in manufacturing situations. Of particular interest are metallographic analysis, detection of solder joint defects and mechanical strength testing of solder joints. Much has been published in the literature on the results of such evaluations in specific applications but little has been available on procedures for use in the microanalysis itself, particularly for fine pitch solder joints. Detailed procedures for fine pitch solder joint microanalysis, which the authors have verified down to 0.5 mm (0.02 in.) lead pitches, are presented. In particular, the authors present procedures for metallographic examination of tin‐lead and tin‐lead‐silver solder joints. In addition, test parameters are given for a repeatable technique of fine pitch solder joint mechanical strength testing that allows mechanical strength measurements to be obtained from almost every lead on a fine pitch surface mount IC package.