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Abstract
AbstractSelenization growth of purely single‐phase, polycrystalline CuIn1–x Alx Se2 (0 ≤ x ≤ 0.26) alloy films was demonstrated using a less‐hazardous metal‐organic selenide, diethylselenide [(C2H5)2Se: DESe]. Without additional thermal annealing, approximately 2.0‐μm‐thick alloy films exhibiting X‐ray diffraction peaks originating exclusively from the chalcopyrite structure were obtained. Their low temperature photoluminescence spectra were dominated by characteristic donor‐acceptor pair emissions usually seen in the state‐of‐the‐art CuInAlSe2 photoabsorbing layers. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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