Preparation and Characterization of BaO–TeO2 Thin Films Obtained from Tellurium(VI) Alkoxide by a Sol–Gel Method

Abstract

BaO–TeO2 thin films were prepared from tellurium(VI) alkoxide by a sol–gel method and their structure was investigated by X‐ray diffractometry, Fourier transform infrared spectrometry, and 125Te static nuclear magnetic resonance. Their crystallization temperature (Tc), optical transmittance, and dielectric constant were measured, and their refractive index was calculated from the transmission spectra. The results indicate that the BaO–TeO2 thin films were composed of TeO6 and TeO4 units, and had a Tc of ∼520°C, refractive index of ∼1.79, dielectric constant of ∼20. These films had a Tc higher than the glass prepared by a melt‐quench method, but their refractive index and dielectric constant were lower. These differences may be due to differences in their structural units.