Abstract
Three major approaches to pattern recognition, (1) template matching, (2) decision-theoretic approach, and (3) structural and syntactic approach, are briefly introduced. The application of these approaches to automatic visual inspection of manufactured products are then reviewed. A more general method for automatic visual inspection of IC chips is then proposed. Several practical examples are included for illustration.
Full Text
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call