Abstract
Photorefractive effects in Ti-indiffused LiNbO3 channel waveguides at λ=0.85 μm are modeled and the theoretical predictions are experimentally verified. This model allows, for the first time, the quantitative prediction of the magnitudes and time evolution of photorefractive effects in LiNbO3 channel waveguide devices and provides a consistent method of characterizing the photorefractive behavior of LiNbO3 channel waveguides.
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