Abstract
The photorefractive effect in the proton-exchanged waveguiding layers formed on lithium niobate and lithium tantalate crystals is investigated. Although the resistance to the photorefractive effect is decreased in the proton-exchanged lithium niobate waveguides by the annealing process, it increases in the case of the proton-exchanged lithium tantalate waveguides. The annealed proton-exchanged waveguides formed on the lithium tantalate crystals are proven to be the most resistant to the photorefractive effect, and are attractive materials for short-wavelength applications.
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