Abstract
We applied the tensor low-energy electron diffraction (LEED) approximation to photoelectron diffraction (PED) for efficient structural searches of complex surfaces including multiple parameters to be optimized. It turned out that the tensor LEED scheme can be included into the multiple-scattering cluster model usually utilized for PED intensity calculation with slight modification concerning the treatment of the atomic displacements of photoelectron emitters. The results of numerical calculation for a simple system show that the approximation is applicable to PED over almost the same range of displacements as in tensor LEED.
Published Version
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