Abstract
The performances of integrated photodetector arrays in demanding applications-spectrometry, beam profiling, etc.-can be improved by means of suitable electronic measurement techniques, namely, by a combination of digital averaging and lock-in detection. A simple microprocessor-based apparatus is described. Experimental results obtained with low-cost imagers in measurements at low light levels are discussed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have