Abstract

Thin films of GaN have been achieved via gas source molecular beam epitaxy with and without substrate illumination from a 500 W Hg arc lamp. X‐ray photoelectron spectroscopy showed a nominally stoichiometric GaN film without contaminants regardless of illumination. Illumination and Ga cell temperature changed the texture of the polycrystalline GaN from (0001)∥(100) to (0001)∥(111) and back again. Near single crystal films were deposited with an orientation relationship of w‐GaN (0001)∥β‐SiC (100) and (1010)∥(011). Resulting films were characterized by scanning electron microscopy as well as x‐ray and electron diffraction.

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