Abstract

In this paper, two Phase frequency detector (PFD) architectures and a PFD with lock-in detection (PFD-LID) are proposed that are designed using the new techniques for selectively resetting the outputs to achieve improved average gain with a lower blind zone. The two proposed PFDs are designed and fabricated using 180 nm CMOS process. The circuits are tested with the variations in the supply voltage from 1.3 V to 1.8 V, achieving higher average gain and the measured blind zone of 3 ps, which is around five times less than earlier reported works. Also, the proposed selective reset techniques are used to design the PFD-LID. Both the PFDs and PFD-LID are validated using the traditional phase-locked loop (PLL) architecture by achieving minimal settling time of the PLL.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.