Abstract
In this paper the results from a study of multiple high-voltage pulse stressing effects on resistance and low-frequency noise of thick-film resistors based on resistor composition with sheet resistance of 10kOmega/sq are presented. For the experimental purposes a series of thick-film test resistors with identical geometries were realized and exhibited to two types of tests: multiple series of 10 pulses with amplitude from the 0.5-4.0kV range and multiple series of 10 pulses with 3kV amplitude. Obtained experimental results were analyzed and correlation between resistance and low-frequency noise changes with resistor degradation due to multiple high-voltage pulse stressing is observed. It is shown that low-frequency noise parameters are more sensitive to this kind of resistor stressing than resistance
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