Abstract
In this paper results from the study of simultaneous mechanical and electrical straining effects on performances of conventional thick-film resistors based on three different resistor compositions with sheet resistances of 1 kΩ/sq, 10 kΩ/sq and 100 kΩ/sq are presented. For experimental purposes thick-film test resistors of different dimensions were realized. Resistors were simultaneously subjected to mechanical straining with maximal substrate deflection of 300 μm and multiple high-voltage pulses. Obtained experimental results are analyzed from micro- and macrostructural, charge transport and low-frequency noise aspects. Correlations between resistance, gauge factor and low-frequency noise changes with resistor degradation due to simultaneous mechanical and electrical straining are observed.
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