Peltier-Cooled Solid State Drift-Chamber Detector for Energy-Dispersive X-Ray Pole Figure Measurement and Texture Mapping

Abstract

Solid-state energy dispersive (ED) x-ray detectors are frequently used in analytical electron microscopy for material analysis and element mapping. They have replaced wavelength dispersive spectrometers since neither a focusing circle set-up nor flat specimens are required. ED spectroscopy has also some specific advantages in the field of x-ray diffraction, in particular with novel energy dispersive x-ray spectrometer systems which are based on the drift-chamber principle.