Abstract

Purpose. Establishment of the mechanism of formation of nanofilms from ultrafine two-dimensional crystals of hexagonal boron nitride.Methods. Film structures from ultrafine two-dimensional crystals of hexagonal boron nitride were created both on the surface of a filament separated from a PA-6 polyamide yarn and on a silicon substrate. Ultra sonication was used to fix UC hBN from an aqueous colloidal system on surfaces. The characterization of UC hBN and films made from them was performed by the following methods: сщт scanning electron with energy dispersive elemental analysis, probe atomic force microscopy, vibrational Fourier IR spectroscopy (and Raman (Raman) scattering, as well as fluorescence spectroscopy, X-ray diffractometry and X-ray phase analysis, small-angle X-ray scattering.Results. The dependence of the intensity of the E2g line (I = 1362.8 cm–1) in the RS spectrum of a film structure deposited on the surface of aqueous CS UC hBN filaments on the time UST – tUST has been studied. Based on the results of the analysis of confocal, SEM and AFM images, RS and FS spectroscopy, the multilayer nature of the UC hBN film structures on the surface of the filaments and the silicon wafer was proved. The FS spectrum contains excitations on lines lying inside the band gap.Conclusion. The formation of structures on the surfaces of filaments and a silicon plate from an aqueous CS of UC hBN particles after UST occurs due to either covalent bonds in the plane of hexagons with abnormal sizes up to 1 μm, or van der Waals and ionic-covalent bonds with the formation of multilayer structures with heights from 3.6 to 340 nm.

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