OSL at elevated temperature of smart chip cards for retrospective dosimetry

Abstract

Smart chip cards are a promising material in retrospective dosimetry due to their high collectability with low replacement cost. In this study, dose reconstruction using OSL at elevated temperatures for various chip cards was investigated. The approximate spectral emission of the chip cards was determined through a comparison of radiation-induced and intrinsic background TL signals using different detection filters. In the OSL decay curve, a fast component (0.0–0.4 s) was integrated to avoid high intrinsic background signals. To minimize sensitivity changes due to heat treatment, a protocol to measure OSL at 100 °C was developed and the data were compared with those from a similar protocol for OSL measured at room temperature. In the 0.1 - 5 Gy range, linear and power functions were fitted for room temperature and 100 °C OSL protocols, respectively. The minimum detectable dose was evaluated immediately after exposure, with values of 25 mGy for room temperature and 240 mGy for 100 °C OSL being determined. Signal fading was measured up to 30 days after irradiation for the investigated protocols. A dose recovery test was made 10 days after irradiation using various chip cards, and the 100 °C OSL protocol produced more reliable results than the room temperature OSL protocol. As a result, the study emphasizes the necessity of further investigation of OSL at high temperatures using chip cards.