Abstract
Abstract Transparent, conductive SnO 2 (FTO) films and colloidal TiO 2 films deposited on these FTO films are investigated by means of contactless transient photoconductance measurements in the microwave frequency range (TRMC measurements). For the bare FTO–glass films excitation with 355 nm light pulses leads to appreciable TRMC signals indicating the semiconductor properties of the material. For TiO 2 films on FTO–glass films, injection of excess electrons from TiO 2 into FTO is observed.
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