Abstract

Transparent conducting films (TCFs) made by the assembly/deposition of silver nanowires (Ag NWs) are widely used to manufacture flexible electronics such as touch screens, heaters, displays, and organic light-emitting diodes. Controlling the dimensions (length and diameter) of the nanowires is key in obtaining TCFs with the desired optoelectronic properties, namely sheet resistance and optical transparency. This work describes a combined experimental and theoretical investigation on the optimization of the NW dimensions to fabricate high-quality TCFs. Ag NWs of different dimensions are synthesized by the modified polyol method and the average diameter and length of the wires are tailored over a wide range, 35–150 nm and 12–130 μm respectively, by controlling the synthesis parameters such as reaction conditions, stabilizing agents, and growth promoters. The synthesized NWs are spin coated on glass substrates to form TCFs. Comparing the films with different lengths, but identical diameters, enabled the quantification of the effect of length on the optoelectronic properties of the TCFs. Similarly, the effect of NW diameter is also studied. A non-uniformity factor is defined to evaluate the uniformity of the TCF and the transmittance of the NW network is shown to be inversely proportional to its area coverage. The sheet conductance versus the normalized number density is plotted for the different concentrations of NWs to extract a conductivity exponent that agrees well with the theoretical predictions. For thin film networks, the relation between the transmittance and sheet resistance provides the percolative figure of merit (FoM) as a fitting parameter. A large FoM is desirable for a good-performing TCF and the synthesis conditions to achieve this are optimized.

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