Abstract
The half-V/sub cc/ sensing scheme of CMOS dynamic RAMs (DRAMs) has been analyzed. It has been found that fluctuations of the cell-plate bias must be taken into account since they can degrade the sense signal. An improvement is possible by connecting the bit lines to the cell plate and its half-V/sub cc/ generator during precharge. Optimum performance of the sense amplifier is achieved if the PMOS and NMOS latches are activated simultaneously. The advantages are: (1) the sensitivity is improved due to the elimination of the offset contribution caused by unmatched capacitive loads; (2) the sensing speed is enhanced due to faster sense signal amplification; and (3) the peak current is reduced since the NMOS latch does not lower the voltage level of both bit line and reference bit line. >
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call