Abstract

The influence of different parameters on etching characteristics of some polymer track detectors was studied. All studies were performed for tracks of alpha particles from a 241 Am source. Polymer solid state nuclear track detectors (SSNTDs) used were: cellulose nitrates KODAK CN 85, and CA 80-15; and poly(allyl diglycol)carbonate CR-39. We varied the following etching parameters: the layer removed by etching from one side of SSNTD; the etching temperature; and the concentration of etchant (NaOH). Both track ( v t ) and bulk ( v b ) etch rates, and their ratio, V were established. Conditions for alpha particles under which V reaches the maximum were found for all three materials. The mechanism of etching is also analysed.

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