Optically Detected Cyclotron Resonance in CdTe

Abstract

Optically Detected Cyclotron Resonance (ODCR) is the combination technique of cyclotron resonance (CR) and photoluminescence (PL), which sufficiently demonstrates its ability. In this work, the ODCR measurements together with PL and CR experiments were carried out to investigate the fundamental properties of typical II–VI compound semiconductor CdTe. From the analysis of experimental results, the formation processes in excitonic system were made clear through close examination of the difference in the ODCR signals for various samples with different impurity concentrations. It is found that the sign of the ODCR signals obtained as a function of the PL wavelength strongly depends on the mobility of the sample, i.e. whether the proper CR spectrum is sharp or broad. From the analysis of rate equations for particles related to the PL it was found that the competition between the variation in capture rate and the change in the impact ionization probability determines the sign of the ODCR signals.