Optical detection of cyclotron resonance for characterization of recombination processes in semiconductors

Abstract

Abstract Novel applications of the technique of optically detected cyclotron resonance (ODCR) are discussed. This method is an extension of the conventional cyclotron resonance investigations and shows important advantages when applied to characterization of semiconductor materials. These advantages are due to a higher sensitivity and a longer momentum relaxation time caused by photoneutralization of ionized impurities. This in turn enables experiments at lower magnetic fields and lower microwave radiation frequency. Photoexcitation used in ODCR often results in a simultaneous observation of electron and hole cyclotron resonances in the same sample, which is a rare case in a conventional CR study. High magnetic field far infrared ODCR experiments utilize all these advantages of the method. For the most common X-band (10 GHz) microwave setups, the ODCR resolution often is too low to allow accurate CR determination of the band structure parameters of the material studied. In that case, ODCR may be used for ...